High resolution reflectivity diffractometer on Station 2.3 (Daresbury Laboratory)

Tang, C. C.; Collins, S. P.; Murphy, B. M.; Telling, N. D.; Wogelius, R. A.; Teat, S. J.

Abstract

A high resolution reflectivity diffractometer (HRRD) has been recently commissioned on Station 2.3 at the SRS, Daresbury Laboratory. Using the instrument which is x-ray wavelength tunable, the characterization of the interface structure in an ion-assisted deposited Co/Cu multilayer has been carried out. In order to improve the electron density contrast of the sample, we have used an x-ray energy near the Cu 
edge of 8.989 keV. By scanning the normal (specular), near normal (off specular), and parallel axes (transverse) of the surface, we have obtained useful reflectivity intensity data. By applying simulations to the data, we have determined a total roughness (rms) of Å
with a significant contribution from correlated interfacial roughness Å
Other detailed structural information obtained has successfully demonstrated that the commissioned instrument is a viable tool for reflectivity studies.

Citation

Tang, C. C., Collins, S. P., Murphy, B. M., Telling, N. D., Wogelius, R. A., & Teat, S. J. (1998). High resolution reflectivity diffractometer on Station 2.3 (Daresbury Laboratory). Review of Scientific Instruments, 69(3), 1224-1229. https://doi.org/10.1063/1.1148754

• Journal Article Type: Article
• Acceptance Date: Dec 8, 1997
• Online Publication Date: Mar 1, 1998
• Publication Date: Mar 1, 1998
• Deposit Date: May 16, 2024
• Journal: Review of Scientific Instruments
• Print ISSN: 0034-6748
• Electronic ISSN: 1089-7623
• Publisher: AIP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 69
• Issue: 3
• Pages: 1224-1229
• DOI: https://doi.org/10.1063/1.1148754
• Public URL: https://keele-repository.worktribe.com/output/828716