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Facility for combined in situ magnetron sputtering and soft x-ray magnetic circular dichroism

Telling, N. D.; van der Laan, G.; Georgieva, M. T.; Farley, N. R. S.

Authors

G. van der Laan

M. T. Georgieva

N. R. S. Farley



Abstract

An ultrahigh vacuum chamber that enables the in situ growth of thin films and multilayers by magnetron sputtering techniques is described. Following film preparation, x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD) measurements are performed by utilizing an in vacuum electromagnet. XMCD measurements on sputtered thin films of Fe and Co yield spin and orbital moments that are consistent with those obtained previously on films measured in transmission geometry and grown in situ by evaporation methods. Thin films of FeN prepared by reactive sputtering are also examined and reveal an apparent enhancement in the orbital moment for low N content samples. The advantages of producing samples for in situ XAS and XMCD studies by magnetron sputtering are discussed.

Citation

Telling, N. D., van der Laan, G., Georgieva, M. T., & Farley, N. R. S. (2006). Facility for combined in situ magnetron sputtering and soft x-ray magnetic circular dichroism. Review of Scientific Instruments, 77(7), https://doi.org/10.1063/1.2219719

Journal Article Type Article
Online Publication Date Jul 18, 2006
Publication Date Jul 1, 2006
Deposit Date May 17, 2024
Journal Review of Scientific Instruments
Print ISSN 0034-6748
Electronic ISSN 1089-7623
Publisher AIP Publishing
Peer Reviewed Peer Reviewed
Volume 77
Issue 7
DOI https://doi.org/10.1063/1.2219719
Public URL https://keele-repository.worktribe.com/output/829054