Temperature dependence of the interface moments in Co2MnSi thin films

Telling, N. D.; Keatley, P. S.; Shelford, L. R.; Arenholz, E.; van der Laan, G.; Hicken, R. J.; Sakuraba, Y.; Tsunegi, S.; Oogane, M.; Ando, Y.; Takanashi, K.; Miyazaki, T.

Abstract

X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in
(CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensitivity of the measurements.
-ordered CMS films show no significant temperature dependence of either the Co or Mn interface moments. However, disordered CMS films show a decreased moment at low temperature possibly caused by increased Mn–Mn antiferromagnetic coupling. It is suggested that for ordered
CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments.

Citation

Telling, N. D., Keatley, P. S., Shelford, L. R., Arenholz, E., van der Laan, G., Hicken, R. J., Sakuraba, Y., Tsunegi, S., Oogane, M., Ando, Y., Takanashi, K., & Miyazaki, T. (2008). Temperature dependence of the interface moments in Co2MnSi thin films. Applied Physics Letters, 92(19), https://doi.org/10.1063/1.2927482

• Journal Article Type: Article
• Online Publication Date: May 13, 2008
• Publication Date: May 12, 2008
• Deposit Date: May 21, 2024
• Journal: Applied Physics Letters
• Print ISSN: 0003-6951
• Electronic ISSN: 1077-3118
• Publisher: AIP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 92
• Issue: 19
• DOI: https://doi.org/10.1063/1.2927482
• Keywords: Spintronics, Magnetic ordering, Epitaxy, Polycrystalline material, Thin films, X-ray spectroscopy, Radioactive decay, Leptons, Chemical elements, Transition metal oxides
• Public URL: https://keele-repository.worktribe.com/output/830809
• Publisher URL: https://pubs.aip.org/aip/apl/article-abstract/92/19/192503/969196/Temperature-dependence-of-the-interface-moments-in?redirectedFrom=fulltext