Phase-resolved x-ray ferromagnetic resonance measurements in fluorescence yield

Marcham, M. K.; Keatley, P. S.; Neudert, A.; Hicken, R. J.; Cavill, S. A.; Shelford, L. R.; van der Laan, G.; Telling, N. D.; Childress, J. R.; Katine, J. A.; Shafer, P.; Arenholz, E.

Abstract

Phase-resolved x-ray ferromagnetic resonance (XFMR) has been measured in fluorescence yield, extending the application of XFMR to opaque samples on opaque substrates. Magnetization dynamics were excited in a Co50Fe50(0.7)/Ni90Fe10(5) bilayer by means of a continuous wave microwave excitation, while x-ray magnetic circular dichroism (XMCD) spectra were measured stroboscopically at different points in the precession cycle. By tuning the x-ray energy to the L3 edges of Ni and Fe, the dependence of the real and imaginary components of the element specific magnetic susceptibility on the strength of an externally applied static bias field was determined. First results from measurements on a Co50Fe50(0.7)/Ni90Fe10(5)/Dy(1) sample confirm that enhanced damping results from the addition of the Dy cap.

Citation

Marcham, M. K., Keatley, P. S., Neudert, A., Hicken, R. J., Cavill, S. A., Shelford, L. R., …Arenholz, E. (2011). Phase-resolved x-ray ferromagnetic resonance measurements in fluorescence yield. Journal of Applied Physics, 109(7), https://doi.org/10.1063/1.3567143

• Journal Article Type: Article
• Online Publication Date: Apr 13, 2011
• Publication Date: Apr 1, 2011
• Deposit Date: May 22, 2024
• Journal: Journal of Applied Physics
• Print ISSN: 0021-8979
• Electronic ISSN: 1089-7550
• Publisher: AIP Publishing
• Peer Reviewed: Peer Reviewed
• Volume: 109
• Issue: 7
• DOI: https://doi.org/10.1063/1.3567143
• Public URL: https://keele-repository.worktribe.com/output/831327