Adam P Hitchcock
Correlative Spectromicroscopy and Tomography for Biomedical Applications involving Electron, Ion, and Soft X-ray Microscopies
Hitchcock, Adam P; Wang, Xiaoyue; Grandfield, Kathryn; Everett, James; Collingwood, Joanna F; Telling, Neil D
Authors
Xiaoyue Wang
Kathryn Grandfield
James Everett j.everett@keele.ac.uk
Joanna F Collingwood
Neil Telling n.d.telling@keele.ac.uk
Abstract
Many important scientific and technical problems are best addressed using multiple, microscopy-based analytical techniques that combine the strengths of complementary methods. Here, we provide two examples from biomedical challenges: unravelling the attachment zone between dental implants and bone, and uncovering the mechanism of Alzheimer's disease. They combine synchrotron-based scanning transmission X-ray microscopy (STXM) with transmission electron microscopy ((S)TEM), electron tomography (ET), EELS tomography, and/or atom probe tomography (APT). STXM provides X-ray absorption based chemical sensitivity at mesoscale resolution (10–30 nm), which complements higher spatial resolution electron microscopy and APT.
Citation
Hitchcock, A. P., Wang, X., Grandfield, K., Everett, J., Collingwood, J. F., & Telling, N. D. (2019). Correlative Spectromicroscopy and Tomography for Biomedical Applications involving Electron, Ion, and Soft X-ray Microscopies. Microscopy Today, 27(2), https://doi.org/10.1017/S1551929518001256
Journal Article Type | Article |
---|---|
Acceptance Date | Mar 14, 2019 |
Publication Date | Mar 14, 2019 |
Journal | Microscopy Today |
Print ISSN | 1551-9295 |
Publisher | Cambridge University Press |
Peer Reviewed | Peer Reviewed |
Volume | 27 |
Issue | 2 |
DOI | https://doi.org/10.1017/S1551929518001256 |
Keywords | scanning transmission X-ray microscopy; scanning transmission electron microscopy; atom probe tomography; titanium implants; Alzheimer's disease |
Publisher URL | https://www.cambridge.org/core/journals/microscopy-today/article/correlative-spectromicroscopy-and-tomography-for-biomedical-applications-involving-electron-ion-and-soft-xray-microscopies/1CFAC59353E5E2F0CBF685EE73AAB7C1 |
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Publisher Licence URL
https://creativecommons.org/licenses/by-nc-nd/4.0/
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