Analysis of the composition of material samples nondestructively by means of standard X-ray tube imaging
is extremely challenging due to the breadth of the
bremsstrahlung spectrum, resulting from mono-energetic
electrons striking a thick tungsten target. In previous work,
stacks of registered field-flattened images of various samples
over an energy range 15-150 keV were created and analysed.
Attempts to remove the effects of the broad spectrum proved
the concept of element-specific imaging, but problems still
remained. In this work, modification strategies to existing
designs are proposed in both hardware and software, which
would bolster efforts to remove the effects of the broad X-ray spectrum.