Synchrotron X-ray reflectivity study of Co/Cu multilayer structure

Tang, C.C.; Telling, N.D.; Langridge, S.

Abstract

We report on the use of Station 2.3 at the SRS Daresbury Laboratory as a high resolution reflectivity diffractometer (HRRD) for the study of interfacial structure in a Co/Cu multilayer grown using the ion-assisted deposition method. Specular, off-specular and diffuse X-ray scattering measurements were obtained from interfaces grown with concurrent ion bombardment under selected deposition conditions. The present work has successfully demonstrated that the HRRD instrument is a viable tool for the structural study of the Co/Cu system. In addition, the reflectivity results have revealed some of the growth mechanisms involved and possible conditions for the optimisation of smooth multilayer interfaces with minimal disorder.

Citation

Tang, C., Telling, N., & Langridge, S. (1998). Synchrotron X-ray reflectivity study of Co/Cu multilayer structure. Physica B: Condensed Matter, 248(1-4), 395-398. https://doi.org/10.1016/s0921-4526%2898%2900270-1

• Journal Article Type: Article
• Online Publication Date: Mar 19, 1999
• Publication Date: 1998-06
• Deposit Date: May 16, 2024
• Journal: Physica B: Condensed Matter
• Print ISSN: 0921-4526
• Publisher: Elsevier
• Peer Reviewed: Peer Reviewed
• Volume: 248
• Issue: 1-4
• Pages: 395-398
• DOI: https://doi.org/10.1016/s0921-4526%2898%2900270-1
• Public URL: https://keele-repository.worktribe.com/output/828737
• Publisher URL: https://www.sciencedirect.com/science/article/pii/S0921452698002701