All Outputs (4)

Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment (1999)
Journal Article
Telling, N., Langridge, S., & Tang, C. (1999). Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment. Journal of Magnetism and Magnetic Materials, 198-199, 692-694. https://doi.org/10.1016/s0304-8853%2898%2901204-9

Spin polarised neutron reflectivity and X-ray reflectivity measurements were performed on a Co/Cu multilayer deposited under ion bombardment. It was found that an average ion energy of ∼200 eV caused a reduction in interface roughness towards the sur... Read More about Spin polarised neutron and X-ray reflectivity study of a Co/Cu multilayer deposited under ion bombardment.

The effect of energetic ion bombardment during growth on the interface structure of Co/Cu multilayers (1999)
Journal Article
Telling, N., Karlsson, C., Crapper, M., & Tang, C. (1999). The effect of energetic ion bombardment during growth on the interface structure of Co/Cu multilayers. Journal of Magnetism and Magnetic Materials, 198-199, 713-715. https://doi.org/10.1016/s0304-8853%2898%2901015-4

A modified unbalanced magnetron sputtering technique was applied to the growth of multilayer Co/Cu films in order to systematically study the interface structure evolved under ion bombardment. X-ray reflectivity measurements revealed an interface smo... Read More about The effect of energetic ion bombardment during growth on the interface structure of Co/Cu multilayers.

Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays (1999)
Journal Article
Tang, C., MacLean, E., & Telling, N. (1999). Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays. Journal of Magnetism and Magnetic Materials, 198-199, 653-655. https://doi.org/10.1016/s0304-8853%2898%2901176-7

Synchrotron powder diffraction measurements were obtained from a Co/Cu multilayer produced by low energy ion-assisted deposition. The experiment was carried out on the high resolution diffractometer on Station 2.3 at the SRS, Daresbury Laboratory. Ex... Read More about Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays.

Multilayer growth by low energy ion beam deposition (1999)
Journal Article
Joyce, D., Telling, N., Van den Berg, J., Lord, D., & Grundy, P. (1999). Multilayer growth by low energy ion beam deposition. Journal of Magnetism and Magnetic Materials, 198-199, 731-733. https://doi.org/10.1016/s0304-8853%2898%2901021-x

We report our progress in the development of a relatively new deposition technique, that of direct low energy ion beam deposition. We describe this technique, which is based on ion implanter technology similar to that used in the semiconductor indust... Read More about Multilayer growth by low energy ion beam deposition.