Synchrotron X-ray diffraction measurements of the FCC/FCT phase transformation in PtMnCr pinning layers

Holloway, L.; Laidler, H.; Hughes, T.; Telling, N.D.; Linville, E.; Mao, S.; Kief, M.T.

Abstract

We examine the change in structure of the pinning layer of PtMnCr/NiFe bilayers in the as-deposited state and upon annealing, using synchrotron radiation. The X-ray measurements show that the degree of transformation of the FCC phase of PtMnCr to the antiferromagnetic FCT phase increases with annealing time. Although a slightly higher amount of the FCT(1 1 1) planes grow at 0°, 25° and 45° with respect to the surface, it is apparent that the re-orientation and growth of the FCT phase is predominantly random. These structural effects are discussed in terms of their effect on the magnetic properties.

Citation

Holloway, L., Laidler, H., Hughes, T., Telling, N., Linville, E., Mao, S., & Kief, M. (2002). Synchrotron X-ray diffraction measurements of the FCC/FCT phase transformation in PtMnCr pinning layers. Journal of Magnetism and Magnetic Materials, 242-245, 1112-1114. https://doi.org/10.1016/s0304-8853%2801%2901120-9

• Journal Article Type: Article
• Online Publication Date: Dec 18, 2001
• Publication Date: 2002-04
• Deposit Date: May 16, 2024
• Journal: Journal of Magnetism and Magnetic Materials
• Print ISSN: 0304-8853
• Publisher: Elsevier
• Peer Reviewed: Peer Reviewed
• Volume: 242-245
• Pages: 1112-1114
• DOI: https://doi.org/10.1016/s0304-8853%2801%2901120-9
• Public URL: https://keele-repository.worktribe.com/output/828828