Temperature dependence of the interface moments in Co2MnSi thin films
(2008)
Journal Article
Telling, N. D., Keatley, P. S., Shelford, L. R., Arenholz, E., van der Laan, G., Hicken, R. J., …Miyazaki, T. (2008). Temperature dependence of the interface moments in Co2MnSi thin films. Applied Physics Letters, 92(19), https://doi.org/10.1063/1.2927482
X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in
(CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensi...
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