Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction (2020)
Journal Article
Felici, M., Patané, A., Polimeni, A., Clark, J., Balakrishnan, N., Clark, J. N., Ravy, S., Ciatto, G., Berenguer, F., & Pettinari, G. (2020). Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction. communications materials, 1, Article 19. https://doi.org/10.1038/s43246-020-0021-6

Coherent x-ray diffractive imaging is a nondestructive technique that extracts three-dimensional electron density and strain maps from materials with nanometer resolution. It has been utilized for materials in a range of applications, and has signifi... Read More about Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction.